Software for downloading, displaying, editing and reporting data from SC420.
The SC420 sound level meter measures a lot of functions for very long periods of time and also records audio files automatically. The best way to approach the analysis of all these functions together with the qualitative information provided by the audio files is to use the CESVA Lab software application.
CESVA Lab is cost free and gives you a simple way to download all the information from the SC420 by simply removing the microSD card and post-process it. It also allows you configuring the SC420 from the PC.
Moreover, it provides an intuitive and user-friendly interface which allows numerically and graphically display of all the measurement information on the screen in several synchronized panels (spectrum and time history graphs and 3D spectrograms) and listen to the audio files for each sound event.
To navigate through the information, CESVA Lab has an audio and mark browser and a very powerful zoom and pan tool for finding the desired section and then automatically generate a PDF report.
If what you want is to recalculate a section, simply select it, add it to a layer and simply calculate. Different layers, containing several sections, can be calculated simultaneously. Each layer is calculated and saved in a separate file.
The LDEN application allows calculating whole-day composite noise rating levels and rating levels during different periods of one whole day. These rating levels are defined in the ISO 1996-1 standard. Once the daytime, evening and night periods and their corresponding penalties are defined, the LDEN application calculates the following rating levels:
The application TWA allows, from a .CDF file type S (SLM) with information on the time base 1s, evaluating the noise exposure of a worker (Average Level Lavg, Time Weighted Average TWA and noise dose D) according to standards from different agencies OSHA, MSHA, NIOSH, ACGIH, and DoD.
The TWA application also allows introducing a projection time (true exposure time), so shorter measurements than the exposure time can be done and then getting the results using the projected parameters.